Atomic Force Microscopy (AFM) is pivotal in nanoscience, offering high-resolution imaging and manipulation for advancements in semiconductors and life sciences.

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Photothermal AFM-IR technology provides spatially resolved infrared spectroscopy for detailed compositional mapping of ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today the release of the new Vero VRS1250 Atomic Force Microscope (AFM), which enables video-rate imaging with line ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...