Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

Regardless of the test methodology employed, the goal of manufacturing test is to identify, or screen out, defective devices before they are embedded into a system or shipped to the end customer. More ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...