TOKYO — Teradyne Inc.'s Japan Division today formally launched a new CMOS image sensor tester, which is capable of parallel testing devices with 25-MHz as the measurement frequency and data capture ...
Teradyne's Japan Division (JD) today unveiled a CMOS image sensor test system for parallel testing of devices. Teradyne's JD claims to have the largest shipment volume and installed base in the image ...
STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...
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