Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Over the last few years, design-for-test (DFT) chip-testing techniques such as internal scan (ISCAN), automatic test-pattern generation (ATPG), built-in self-test (BIST), and boundary scan (BSCAN) ...

Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

The purpose of electronic design automation (EDA) software is to solve SoC design problems and simplify the entire process. For design for test (DFT), this means aiming to streamline the DFT ...

The use of redundant logic may increase product reliability. Two of the most costly functions that engineering teams developing electronic products perform are verification and test. On the surface, ...

Acquisition integrates advanced "shift-left" Design for Test (DFT) functionality into Siemens' Xpedition and Valor portfolios ...

Siemens plans to integrate Aster's advanced "shift-left" design for test functionality into Siemens' Xpedition and Valor ...

Siemens has announced the acquisition of ASTER Technologies, a provider of printed circuit board assembly (PCBA) test ...

This strategic move integrates ASTER’s advanced "shift-left" design for test (DFT) functionality directly into Siemens' ...