Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.
When it comes time to test applications for flaws, when is a bug a security defect, and when is it a quality defect? According to some developer experts, during preproduction the line can be so blurry ...
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