New KV cache compaction technique cuts LLM memory 50x without accuracy loss

MIT researchers developed Attention Matching, a KV cache compaction technique that compresses LLM memory by 50x in seconds — ...
Business Wire

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...
EDN

How to test high-speed memory with non-intrusive embedded instruments, Part 2

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...
Electronic Design

The Challenges of Memory Mix Test

The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
Semiconductor Engineering

AI Memory: Enabling The Next Era Of High-Performance Computing

The rapid advancement of artificial intelligence (AI) is driving unprecedented demand for high-performance memory solutions. AI-driven applications are fueling significant year-over-year growth in ...