Ripples arise while characterizing devices at RF and microwave frequencies. RF engineers need to make sure that measurement set-up is properly calibrated and matched in order to avoid measurement ...

In this interview, Tim Skunes from CyberOptics Corporation talks to AZoM about their 3D optical inspection technology, and how it can be used to solve challenges in SMT electronics manufacturing.

Manufacturers are adopting automated optical inspection (AOI) systems based on phase shift profilometry (PSP) for applications in advanced packaging processes. Many of these processes use front ...

Figure 1: CLCs and multi-CLC systems with a single pitch. Figure 2: Simulated reflection spectra of multi-CLC systems at normal incidence of L-CP. Hence, we can conclude that broader multiple PBGs ...

Java 7 adds a new exception class called ReflectiveOperationException. The Javadoc documentation describes this class as a “Common superclass of exceptions thrown by reflective operations in core ...