“The IP package for sale provides a novel probe design with reduced loading effects at all frequency ranges. This portfolio is highly relevant to companies involved in developing and manufacturing ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

Today’s electronic circuit-board technology is posing a big challenge to in-circuit test techniques because of the disappearance of access. As a result, a shift from bed-of-nail to flying-probe ...

LIVERMORE, Calif. — FormFactor Inc. here today (Feb. 15) announced a major advancement in probe-card technology that enables IC manufacturers to test up to 128 chips on a wafer with a single ...

Not knowing how to troubleshoot electrical issues is a death sentence for any DIYer’s bank account. Your only other option is a wild goose chase by throwing money at your car until the problem’s fixed ...

MEASURING live voltages and current in today's high-energy environments can result in a severe hazard to equipment and users if proper precautions are not applied. Given the risk of transients, surges ...