Electronics are getting more sophisticated and complex every day. Chips, boards, and the systems they comprise are increasingly difficult to design. Companies engaged in electronic product development ...
An improved family of embedded test IP products delivers significant benefits to designers of systems-on-a-chip (SoCs) and other complex ICs. These products improve testing efficiency, speed, and ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Wind tunnels aren’t just for testing aircraft anymore. Climatic wind tunnels, a variation on traditional wind tunnels, have been used by a host of large-scale manufacturers to thoroughly test ...
David leads the editorial team at CNET. We create expert reviews, articles and video on every aspect of technology, from AI to Zoox. We are thoroughly, proudly human. Expertise A 25-year CNET veteran, ...
Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...
When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
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