Maybe you should try boundary scan testing now that your continuity buzzer has died. Most engineers are familiar with the theory of boundary scan testing, but what about having actual hands-on ...

The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

Scan technology now is standard practice for digital designs. Each sequential element, either a flip-flop or latch, is replaced by a scan cell. The scan cells function as typical sequential elements ...

Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

Scan network security and attack mitigation play a pivotal role in safeguarding integrated circuits (ICs) and networked devices from unauthorised access, data extraction, and side‐channel attacks.