Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...
Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...
This panel will modify the raw image data. There is a Title Box just below the tabs that will have the name of the graph/image that will be modified. It is good to double check this if you have ...
The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.
Researchers have developed a compact handheld imaging probe that could expand the clinical and research use of photoacoustic ...