Test compression offers the benefits of higher quality and lower test cost, but how do you choose the best methodology and tools for your current and future designs? Test compression evaluations ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Testing can represent as much as half the cost of semiconductor device manufacture. To reduce that, Mentor Graphics' TestKompress uses a new compression technology that lets designers cut the amount ...

As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...

Compression tests are used to characterize various compressive properties such as the compression modulus and compressive strength. They are performed on fiber-reinforced composites with ...