AZOM

Advanced Semiconductor Failure Analysis with Sub-Micron IR Microspectroscopy

These developments continue to fuel growing investment into the technology and manufacture of semiconductor devices at both industrial and academic research levels. Improvements in technology, ...
AZOM

Transcending Traditional Mid-IR Analysis with NIR Microscopy

Fourier transform infrared (FTIR) micro-spectroscopy merges infrared (IR) spectroscopy with visualization. As IR spectroscopy offers high specificity for molecular structure and chemical composition, ...
Semiconductor Engineering

ML Method To Predict IR Drop Levels

A new technical paper titled “IR drop Prediction Based on Machine Learning and Pattern Reduction” was published by researchers at National Tsing Hua University, National Taiwan University of Science ...
Semiconductor Engineering

Using AI/ML To Minimize IR Drop

IR drop is becoming a much bigger problem as technology nodes scale and more components are packed into advanced packages. This is partly a result of physics, but it’s also the result of how the ...
Optics

ImageIR® 12300: Next Level Details / High-end Thermography with Maximum Native IR Resolution of (2,560 × 2,048) IR Pixel

The new ImageIR® 12300 from InfraTec is the radiometrically calibrated infrared camera with the world's highest commercially available native resolution of 5.2 Megapixels. The powerful top model of ...