Because I work for a provider of test tools that enable andproduce production test patterns, I am often asked what the best patterns areto use for production test. The answer depends on the device ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

It should come as no surprise that Moore's Law of regularly doubling chip capacity is having an impact on automatic test equipment (ATE) for ICs. ATE, of course, applies patterns of signals and checks ...

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...