Semiconductor Engineering

Integrating Design Verification To Approach Zero Defects

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...
Electronic Design

ATPG Tool Delivers Design-For-Test Solution

In its latest version, FastScan 2001 automatic test pattern generation (ATPG) tool reportedly can reduce test pattern sizes by as much as 60%. It can also test small embedded memories and other macros ...
Semiconductor Engineering

A Lightweight Scan Instrumentation For Enhancing The Post-Silicon Test Efficiency in ICs (U. of Florida)

A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
EDN

“Fault coverage analysis for ATPG generated vectors & random vectors”

•Average fault coverage for randomly generated test vectors was 60% or better depending on the type of circuit and the number of vectors applied (Max 98% or better). •Fault coverage for test vectors ...
Electronic Design

Using Timing Constraints For Generating At-Speed Test Patterns

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...