At embedded world, on the DigiKey booth, Paige Hookway speaks with Miha Gjura at Red Pitaya, about new ways for multichannel synchronisation.

With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.

New capabilities let engineers build scalable, synchronized multiboard systems with dramatically faster data throughput ...

Pickering Interfaces has launched Test System Architect (TSA), a free, online tool designed to solve signal path problems.

While it’s definitely nice that the new HDA125 digital analyzer from Teledyne LeCroy zips along at 12.5 GSamples/s on 18 input channels, a closer look shows that the story is more about addressing ...