Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

Left: This is a simulated atomic force microscopy image. In this method, the tip of the microscope scans the surface of the sample (here: a single cobalt phthalocyanine (CoPC) molecule), measuring the ...