Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...
Abstract: Deep learning-based image classification models have been widely applied in the Industrial Internet of Things (IIoT), but studies have shown that adversarial attacks can cause ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results