IEEE

Hierarchical Attention Module-Based Hotspot Detection in Wafer Fabrication Using Convolutional Neural Network Model

Abstract: Wafer mappings (WM) help diagnose low-yield issues in semiconductor production by offering vital information about process anomalies. As integrated circuits continue to grow in complexity, ...
GitHub

CHIEF - Clinical Histopathology Imaging Evaluation Foundation Model

Wang X^, Zhao J^, Marostica E, Yuan W, Jin J, Zhang J, Li R, Tang H, Wang K, Li Y, Wang F, Peng Y, Zhu J, Zhang J, Jackson CR, Zhang J, Dillon D, Lin NU, Sholl L ...
GitHub

Multi-Feature Tagger of English (MFTE)

The Multi-Feature Tagger of English (MFTE) was originally based on the MFTE Perl (Le Foll 2021). The present, substantially improved Python version considerably expands the number of tagged features.
IEEE

Power Cycling Modeling and Lifetime Evaluation of SiC Power MOSFET Module Using a Modified Physical Lifetime Model

Abstract: This study aims to explore the solder fatigue lifetime of a developed high-voltage (1.7 kV/100 A) SiC power MOSFET module for on-board chargers (OBCs) subjected to power cycling test (PCT) ...