PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Implement pattern matching for technical skills Categorize skills into domains (Programming, Web Tech, Cloud, etc.) Calculate frequency analysis of skills Generate insights on most in-demand skills ...

Abstract: In underwater subsea environments light attenuation, water turbidity, and limitations of the optical devices make the captured images suffer from poor contrast and quality, proportional ...

Abstract: To assess structural unit health over time, academics have focused increasingly on structural damage detection. The magnitude and location of damage after an earthquake or terrorist strike ...